Fringe projection system and method for a probe suitable for phase-shift analysis
US7821649B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2008 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | Jan 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2527
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.