Generating self-checking test cases from a reduced case analysis graph using path constraints
US7823100B1 · kind B1 · utility
2Cited by
23References
22Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 11, 2007 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | Jan 15, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and apparatus for constructing a comprehensive test plan for a design under test (DUT) using a case analysis graph is provided. Embodiments of the present invention provide for automatically generating test cases of the test plan from the case analysis graph by traversing paths through the case analysis graph to select a sequence of components to be exercised by a DUT. Selection of the components is constrained by one or more rules. The rules, in aspects of the invention, provide for selection of specified components to be included in the sequence of components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.