Compact achromatic optical interferometer of the three-wave lateral shearing type
US7826066B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2008 |
| Grant date | Nov 2, 2010 |
| Priority date | — |
| Expiry date | Jan 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a system for analyzing the wavefront of a light beam, wherein a diffraction grating is arranged in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analysis plane. Different emerging beams of the grating interfere to generate an image having deformations linked to the gradients of the wavefront to be analyzed.The method is characterized in that the grating carries out the multiplication of an intensity function which is implemented by a two-dimensional grating with hexagonal meshing of surface S transmitting the light of the beam to be analyzed into plural emerging beams arranged in a hexagonal meshing, by an phase function which is implemented by a two-dimensional grating with hexagonal meshing of surface 3S which introduces a phase shift close to 2π/3 (modulo 2π) between two adjacent secondary beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.