Patent · US Active

Imprint method, imprint apparatus, and process for producing chip

US7828984B2 · kind B2 · utility

7Cited by
5References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 2006
Grant dateNov 9, 2010
Priority date
Expiry dateSep 9, 2029

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y40/00
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

An imprint method for imprinting an imprint pattern of a mold onto a pattern formation material on a substrate so as to realize a high throughput includes the steps of bringing the imprint pattern and the pattern formation material into contact with each other; applying a first pressure between the mold and the substrate to increase a contact area between the imprint pattern and the pattern formation material; and adjusting a positional relationship between the mold and the substrate at a second pressure lower than the first pressure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.