Eddy current system and method for estimating material properties of parts
US7830140B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2007 |
| Grant date | Nov 9, 2010 |
| Priority date | — |
| Expiry date | Jun 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.