Patent · US Active

Method for high spatial resolution examination of samples

US7830506B2 · kind B2 · utility

0Cited by

5References

18Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Hilmar Gugel · Dossenheim, DE
Marcus Dyba · Wetzlar, DE
Volker Seyfried · Schallstadt, DE

Key dates

Filing date	Jan 16, 2007
Grant date	Nov 9, 2010
Priority date	—
Expiry date	Sep 12, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/6458
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.