Methods of programming non-volatile semiconductor memory devices using different program verification operations and related devices
US7830720B2 · kind B2 · utility
3Cited by
4References
17Claims
0Family size
Assignee
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Key dates
| Filing date | May 13, 2008 |
| Grant date | Nov 9, 2010 |
| Priority date | — |
| Expiry date | Jan 23, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/3436
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of programming a non-volatile memory device includes receiving data to be programmed into memory cells of the memory device, programming the memory cells with the data, and selectively performing one of a plurality of program verify operations based on a current program loop number to determine whether the memory cells have been successfully programmed. For example, one of a wired-OR pass/fail check operation and a Y-scan pass/fail check operation may be performed according to the current program loop number. Related methods and devices are also discussed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.