SMI memory read data capture margin characterization circuits and methods
US7830737B2 · kind B2 · utility
1Cited by
7References
16Claims
0Family size
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Key dates
| Filing date | Jun 27, 2008 |
| Grant date | Nov 9, 2010 |
| Priority date | — |
| Expiry date | Dec 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50012
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention is directed to margin characterization of memory devices, such as interface ASICs connected to SDRAM. The circuits and method perform margin characterization on a chip during wafer test; however the characterization could also be performed at module test or in a system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.