Total layer thickness detection apparatus, charging device, image forming apparatus, total layer thickness detection method and computer readable medium storing program for total layer thickness detection
US7831157B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2007 |
| Grant date | Nov 9, 2010 |
| Priority date | — |
| Expiry date | Nov 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/5037
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A total layer thickness detection apparatus for a charged body includes: a saturated charge amount detection unit that detects a saturated charge amount of a charged body having plural coating layers with mutually different relative dielectric constants; a storage unit that stores relation information indicating relation of change of the saturated charge amount of the charged body with respect to a change of layer thickness of a surface layer of the charged body; and a calculation part that calculates a total layer thickness of the plural coating layers of the charged body based on the change of the saturated charge amount detected by the saturated charge amount detection unit and the relation information stored in the storage unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.