Generating test coverage bin based on simulation result
US7831879B2 · kind B2 · utility
1Cited by
10References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2008 |
| Grant date | Nov 9, 2010 |
| Priority date | — |
| Expiry date | Feb 21, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/261
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.