Patent · US Active

Testing subsystems on platforms for software applications

US7831962B2 · kind B2 · utility

8Cited by

1References

45Claims

0Family size

Assignee

Oracle International Corporation · US

Inventors

Niloy Banerjee · Mountain View, US
Bret Foreman · San Francisco, US
Theodore R. Haining · San Bruno, US
Parikshit Bhaduri · Foster City, US
Brom Mahbod · Redwood City, US
Michael David Kavanaugh · San Francisco, US
Dhaval Babulal Shah · Foster City, US
William Fillmore Manry, IV · Monte Sereno, US
Henry Willard · San Francisco, US
John John E. So · Redwood City, US

Key dates

Filing date	Jun 3, 2003
Grant date	Nov 9, 2010
Priority date	—
Expiry date	Aug 23, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3696
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Techniques for testing subsystems on a platform for a software application are provided. A test application receives instructions for calling platform dependent subsystems directly. The instructions can be designed to fully test the capabilities of the subsystems. Once the instructions are executed, the results of the subsystems can be analyzed for platform certification, performance, reliability, and/or characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.