Dark correction for digital X-ray detector
US7832928B2 · kind B2 · utility
14Cited by
19References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2008 |
| Grant date | Nov 16, 2010 |
| Priority date | — |
| Expiry date | Jan 26, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10116
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of forming an offset-corrected exposure image includes obtaining an initial exposure image and exposure metadata related to the initial exposure image. An intermediate offset-corrected exposure image is formed by obtaining one or more dark images associated with the initial exposure image and subtracting an averaged value of the one or more dark images from the initial exposure image. The offset-corrected exposure image is obtained by combining an offset adjustment map with the intermediate offset-corrected exposure image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.