Ion detection using a pillar chip
US7834314B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2008 |
| Grant date | Nov 16, 2010 |
| Priority date | — |
| Expiry date | Apr 8, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/143333
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
Methods and assemblies for ion detection in samples using a chip with elevated sample zones, also known as a “pillar chip.” Methods include analyzing such a sample by desorbing a sample from a chip, producing a described ion sample and detecting the same. The chip comprises a base having a surface and one or more structures protruding above the surface of the base. Each structure comprises a pillar and a sample zone, the latter containing a support material and the sample to be analyzed. Assemblies include a chip such as that described above and a conductive element that comprises an aperture of sufficient proportion to allow passage of a molecular ion and that is adapted to be at a different electrical potential than the base of the chip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.