Apparatus and method to detect and correct for mode hop wavelength error in optical component measurement systems
US7835009B2 · kind B2 · utility
3Cited by
3References
34Claims
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Key dates
| Filing date | Apr 10, 2007 |
| Grant date | Nov 16, 2010 |
| Priority date | — |
| Expiry date | Jan 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of and system for correcting mode hop wavelength error in data obtained measuring optical characteristics over a number of wavelengths, includes at a location where mode hop wavelength error occurs in an assemblage of data, representing optical characteristics with respect to wavelength of incident electromagnetic energy of a device under test, compensating or correcting the data to overcome errors due to mode hop occurring in the measurement process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.