Swept annode CT scanner
US7835488B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2007 |
| Grant date | Nov 16, 2010 |
| Priority date | — |
| Expiry date | Nov 21, 2027 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/4488
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A computed tomography method includes rotating an electron beam along an anode (104) disposed about an examination region (112) for a plurality of sampling intervals in which x-ray projections are sampled. The electron beam is swept during each sampling interval to generate a plurality of successive focal spots at different focal spot locations during each sampling interval, wherein the focal spots generated in a given sampling interval include a sub-set of the focal spots generated in a previous sampling interval. The x-ray projections radiated from each of the plurality of focal spots is sampled during each sampling interval. The resulting data is reconstructed to generate volumetric image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.