Patent · US Active

System and method for X-ray diffraction imaging

US7835495B2 · kind B2 · utility

30Cited by

28References

18Claims

0Family size

Assignee

Morpho Detection, LLC · US

Inventor

Geoffrey Harding · Hamburg, DE

Key dates

Filing date	Oct 31, 2008
Grant date	Nov 16, 2010
Priority date	—
Expiry date	Nov 7, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01V5/222
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.