Patent · US Active

Service and diagnostic logic scan apparatus and method

US7836347B2 · kind B2 · utility

0Cited by

5References

9Claims

0Family size

Assignee

GE INTELLIGENT PLATFORMS INC. · US

Inventors

Daniel Miller · Hermosa Beach, US
Ferrell Mercer · Earlysville, US
Judy Popelas · Charlottesville, US

Key dates

Filing date	Oct 17, 2007
Grant date	Nov 16, 2010
Priority date	—
Expiry date	Sep 28, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG05B2219/13173
WIPO fieldControl
WIPO sectorInstruments

Abstract

A diagnostic and service logic program for a programmable logic controller (PLC) is provided in parallel with the main machine logic program. The diagnostic and service logic program has the same functionality as the main machine logic program, but can be modified and operated independently of the main machine logic program for testing and debugging a faulty main machine logic program. The PLC can be switched between programs for testing and debugging.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.