Patent · US Active

Planar test substrate for non-contact printing

US7838195B2 · kind B2 · utility

0Cited by

6References

21Claims

0Family size

Assignee

E.I. DU PONT DE NEMOURS AND COMPANY · US

Inventors

Charles D. Lang · Wysox, US
Nigel Morton Coe · Lompoc, US
Stephen Sorich · Goleta, US
Nageswara Rao Tadepalli · San Jose, US

Key dates

Filing date	Jun 7, 2007
Grant date	Nov 23, 2010
Priority date	—
Expiry date	Dec 18, 2028

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB41C1/10
WIPO fieldTextile and paper machines
WIPO sectorMechanical engineering

Abstract

There is provided an essentially planar test substrate for non-contact printing. The substrate has a first layer having a first surface energy and having a planar measurement portion. A liquid containment pattern is over at least the measurement portion of the first layer. The liquid containment pattern has a second surface energy that is different from the first surface energy. The measurement portion of the first layer and the liquid containment pattern together are substantially planar.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.