Patent · US Active

Substrates, systems and methods for analyzing materials

US7838847B2 · kind B2 · utility

124Cited by
62References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2007
Grant dateNov 23, 2010
Priority date
Expiry dateOct 31, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/7786
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Substrates, systems and methods for analyzing materials that include waveguide arrays disposed upon or within the substrate such that evanescent fields emanating from the waveguides illuminate materials disposed upon or proximal to the surface of the substrate, permitting analysis of such materials. The substrates, systems and methods are used in a variety of analytical operations, including, inter alia, nucleic acid analysis, including hybridization and sequencing analyses, cellular analyses and other molecular analyses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.