Substrates, systems and methods for analyzing materials
US7838847B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2007 |
| Grant date | Nov 23, 2010 |
| Priority date | — |
| Expiry date | Oct 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/7786
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Substrates, systems and methods for analyzing materials that include waveguide arrays disposed upon or within the substrate such that evanescent fields emanating from the waveguides illuminate materials disposed upon or proximal to the surface of the substrate, permitting analysis of such materials. The substrates, systems and methods are used in a variety of analytical operations, including, inter alia, nucleic acid analysis, including hybridization and sequencing analyses, cellular analyses and other molecular analyses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.