Multi-modality inspection system
US7840367B2 · kind B2 · utility
7Cited by
12References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2007 |
| Grant date | Nov 23, 2010 |
| Priority date | — |
| Expiry date | Jan 5, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.