Temperature measuring system and measuring method using the same
US7841770B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2008 |
| Grant date | Nov 30, 2010 |
| Priority date | — |
| Expiry date | Jul 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.