Image segmentation system and method with improved thin line detection
US7844118B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2009 |
| Grant date | Nov 30, 2010 |
| Priority date | — |
| Expiry date | Jul 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30176
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein is a method for detecting thin lines in image data. The method is performed by a processor to process contone image data. The processing includes combining a first result of thin line detection using a first method and a second result of thin line detection using a second method to produce an improved thin line determination in the image data. The methods include processing and thresholding in the contone and binary domain to determine if a thin line exists in the window of image data. The thin line determination may also be merged with the image data as processed using other image segmentation techniques. The disclosed method produces better quality output images and reduces the addition of false lines in an image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.