Method of calibrating temperature compensated sensors
US7844414B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 4, 2008 |
| Grant date | Nov 30, 2010 |
| Priority date | — |
| Expiry date | Mar 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/02491
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibrating an individual sensor of a particular sensor type whose output varies non-linearly with at least one measured quantity and at least one operating condition. The first step includes producing a set of calibration curves for each sample sensor of the particular sensor type. The resulting sets of calibration curves are then averaged and the results used to produce a generic calibration surface for the particular sensor type showing its variation. Individual calibration measurements are then taken for a number of different values of the measured quantity at a small number of discrete values. The individual calibration readings are then used to map the generic calibration surface to the individual calibration measurements of the individual sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.