Patent · US Expired

Method to analyze and correct dynamic power grid variations in ICs

US7844438B1 · kind B1 · utility

10Cited by
14References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 28, 2004
Grant dateNov 30, 2010
Priority date
Expiry dateMar 13, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method to analyze and correct dynamic power grid variations in an IC includes performing a dynamic power grid analysis of the circuit, identifying an excessive dynamic power grid voltage fluctuation from the analysis, and modifying the circuit to reduce the excessive dynamic power grid fluctuation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.