System and method of measurement for a distributed computer system
US7844703B2 · kind B2 · utility
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14References
14Claims
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Key dates
| Filing date | Nov 2, 2006 |
| Grant date | Nov 30, 2010 |
| Priority date | — |
| Expiry date | Oct 24, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04J3/0682
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system and method of parameter measurement for a distributed computer system, the method including selecting a master unit; selecting slave units operably connected to the master unit on a bus, the slave units having a slave clock; determining slave unit latencies between the master unit and the slave units; generating slave unit synchronizing signals for the slave units, the slave unit synchronizing signals being adjusted for the slave unit latencies; synchronizing the slave clocks in response to the slave unit synchronizing signals; and measuring an operating parameter at the slave units at a synchronously determined time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.