Active matrix substrate, display device, and active matrix substrate inspecting method
US7847577B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2007 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | Jul 9, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/131
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.