High-sensitivity method for detecting differences between the physically measurable properties of a sample and a reference

US7847930B2 · kind B2 · utility

Assignee

• BASF SE

Inventors

• Ruediger Sens · Mannheim, DE
• Erwin Thiel · Siegen, DE

Key dates

• Filing date: Dec 21, 2005
• Grant date: Dec 7, 2010
• Expiry date: Apr 3, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J3/50
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for detecting differences between physically measurable properties of a sample and a reference sample. A two-dimensional reference field is generated and first and second two-dimensional patterns are produced respectively from the reference sample and the sample. A correction is made to sample response functions to eliminate time-dependent and location-dependent fluctuations of the detector.