Method for correcting spectral interference in ICP emission spectroscopy (OES)
US7847934B2 · kind B2 · utility
0Cited by
2References
10Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 27, 2006 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | Sep 20, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/443
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.