Microscope calibration apparatus and method and stage including calibration apparatus
US7848019B2 · kind B2 · utility
3Cited by
2References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 10, 2007 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | Nov 5, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/26
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A stage for supporting a specimen slide and for calibrating a microscope includes a base and a calibration component integral with the base. The calibration component includes at least one calibration element for positional calibration and at least one calibration element for optical calibration. Calibration of the microscope can be performed without the need for independent calibration slides. The calibration component may be a glass calibration component or may be defined by a calibration element formed or etched through the base.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.