Patent · US Active

Media defect removal in disk drive head testing

US7848037B2 · kind B2 · utility

2Cited by

10References

18Claims

0Family size

Assignee

Hitachi Global Storage Technologies Netherlands B.V. · NL

Inventors

Youping Deng · Saratoga, US
Terry Farren · Fremont, US
Jing Zhang · Dalian, CN

Key dates

Filing date	Nov 19, 2007
Grant date	Dec 7, 2010
Priority date	—
Expiry date	Jan 8, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/09
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.