Non-destructive inspection apparatus
US7848894B2 · kind B2 · utility
6Cited by
1References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2009 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | May 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A free-hand inspection apparatus for non-destructively inspecting a structure includes an array and an inertial sensor. The array includes a plurality of elements for transmitting and receiving inspection signals towards and from a structure being inspected. The inertial sensor measures acceleration and angular rotation rate in X, Y, and Z directions of the array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.