Identifying and using critical fields in quality management
US7849062B1 · kind B1 · utility
10Cited by
3References
40Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 25, 2010 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | May 25, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q20/10
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
Methods and systems for identifying critical fields in documents, for example so that quality improvement efforts can be prioritized on the critical fields. One aspect of the invention concerns a method for improving quality of a data processing operation in a plurality of documents. A set of documents is sampled. An error rate for fields in the documents is estimated based on the sampling. Critical fields are identified based on which fields have error rates higher than a threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.