Generating self-checking test cases from a reduced case analysis graph using path inheritance
US7849425B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2007 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | Sep 11, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and apparatus for constructing a comprehensive test plan for a design under test (DUT) using a hierarchy of goals to generate test cases are provided. Embodiments of the present invention provide for automatically generating a first test case of the test plan from the goal hierarchy by traversing a path from a starting goal to an ending goal, wherein a first goal in the path has a first definition for one or more of a slot and a method. The ending goal of will then assume the first definition of the slot or method, as needed. A further aspect of the invention is generating a second test case by traversing a second path through the hierarchy. If the second path involves traversing a second goal with a second definition of the slot or method, then the ending goal will assume the second definition of the slot or method, as needed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.