Method of self calibrating a positioning system for positioning an element in a working space
US7853352B2 · kind B2 · utility
2Cited by
11References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 3, 2006 |
| Grant date | Dec 14, 2010 |
| Priority date | — |
| Expiry date | Apr 30, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37067
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method of self calibrating a positioning system, by positioning a reference device provided with reference markings at different calibration locations, and sensing the positions of the reference markings at each calibration location, is provided. The calibration parameters are selected such that differences in relative positions of the sensed locations, expressed in actual coordinates for different calibration locations are reduced or preferably minimized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.