Banding profile estimator using multiple sampling intervals
US7855806B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2007 |
| Grant date | Dec 21, 2010 |
| Priority date | — |
| Expiry date | Jun 17, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K15/027
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of integrating multiple sampling interval image data with timing information from a defect once-around sensor and the machine page sync signals to estimate a banding profile. By augmenting the sampling interval data with the timing data, proper phasing of each frequency over each sampling interval can be maintained. Specifically, when the data over the multiple intervals is taken, the defect source once-around signal and the page sync signals are also recorded. The combination of this information allows the algorithm to extract phase and amplitude information of banding defects from the sampling intervals using a new matched-filter based parameter estimation algorithm. Estimated banding profiles are then generated from the known frequencies, and the estimated amplitude and phase values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.