Method for production of a multi-layer analysis element
US7857924B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2007 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Jul 18, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T156/1084
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
The invention relates to a method for production of a multi-layer analysis element for liquid samples, with at least one test field for the analysis of the liquid samples, in which method an analysis element blank composed of at least two superposed material layers is made available. The multi-layer analysis element or a constituent part of the multi-layer analysis element is cut out from the analysis element blank by means of laser radiation. The laser radiation cuts through different material layers in at least two areas and has a laser power which is effective for the cutting and which is varied as a function of the thickness and the material of the different material layers to be cut in the areas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.