Patent · US Active

Position-measuring device

US7858922B2 · kind B2 · utility

5Cited by

2References

20Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Wolfgang Holzapfel · Obing, DE
Michael Hermann · Tacherting, DE
Karsten Saendig · Palling, DE

Key dates

Filing date	Nov 19, 2007
Grant date	Dec 28, 2010
Priority date	—
Expiry date	Feb 19, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/38
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position extends. The scanning unit includes a first scanning device for generating the reference-pulse signal and a second scanning device for generating the incremental signals. To generate the incremental signals, a scanning beam acts at least once upon each incremental graduation in an incremental-signal scanning field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.