Method involving a pointing instrument and a target object
US7859655B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2008 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Aug 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/88
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A first method determines a position of a point of interest on a target object surface in a target object coordinate system using orientation and distance measurements of a pointing instrument in an instrument coordinate system. A second method determines an orientation of a pointing instrument in an instrument coordinate system for the instrument to be aligned with a point of interest on a target object surface having a target object coordinate system, wherein a position of the point of interest in the target object coordinate system is known. A third method controls orientation of a laser beam of a laser in an instrument coordinate system for the laser beam to trace an image on a target object surface having a target object coordinate system, wherein positions of points for the image on the surface of the target object in the target object coordinate system are known.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.