Plurality of samples and method for selecting a target sample therefrom
US7859664B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2008 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Jul 10, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/075
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a plurality of samples, each of which includes particles of a predetermined particle dimension, within narrow predetermined limits, dispersed in a carrier at a predetermined particle concentration. The predetermined particle dimension and the predetermined particle concentration are the same for each sample. However, advantageously, each sample has a different predetermined ratio of a value of an optical property of the particles to a value of the same optical property of the carrier. The present invention also provides a method for selecting a target sample from the plurality of samples to assess the measurement accuracy or the detection sensitivity of an optical particle analyzer as the predetermined ratio approaches 1.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.