Optical calibration system and method
US7859677B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 2006 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Jan 21, 2028 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/0025
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An optical system calibration system and method particularly suited for calibrating the optical slit planes in an ophthalmic diagnostic instrument. The system includes an illumination source projector, an illumination image receiver, and a calibration component all having known relative positions, orientations and physical and optical characteristics. The calibration component includes at least two separated, diffusely reflecting surfaces. Images of an exemplary slit illumination pattern projected onto the calibration component and formed on the diffusely reflecting surfaces are detected by the image receiver such as a video camera. Based upon camera image coordinates and triangulation parameters of the projector, the receiver, and the calibration component, the slit image positions on the image detector plane can be calibrated to the axially displaced, diffusely reflecting calibration component surface positions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.