Method and apparatus for model driven testing
US7859706B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Sep 26, 2006 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Oct 28, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for providing information about a model of a test for an application, using an application model, the method comprising the steps of: providing a pre configuration of the application or a part thereof; providing a transformation parameter; and providing an at least one post configuration of the at least one application or a part thereof. Once the pre-configuration, transformation parameter of post-configuration are provide, a test description is generated, which can then be compiled to suit and testing tool or environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.