Patent · US Active

Abnormality diagnosing apparatus and abnormality diagnosing method

US7860663B2 · kind B2 · utility

25Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 13, 2005
Grant dateDec 28, 2010
Priority date
Expiry dateDec 20, 2028

Classification

  • Technology area (CPC F)Mechanical Engineering; Lighting; Heating
  • CPC primaryF16C2233/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A abnormality diagnosing apparatus used in a machine equipment including a rotating or sliding part relative to a stationary member includes a detecting portion 31 fixed to the rotating or sliding part or the stationary member and including a vibration sensor 32 and a temperature sensor 33, and a signal processing portion 81 for determining a state of the part from a detecting signal outputted by the detecting portion 31. The signal processing portion 81 determines presence or absence of a abnormality, or presence or absence of the abnormality and a degree of a damage of the part based on a combination of a measured result by the vibration sensor 32 and a measured result by the temperature sensor 33.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.