Intelligent integrated diagnostics
US7860682B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 29, 2004 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Jan 17, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0251
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A diagnostics system comprising a topological map of a target system that has nodes (38, 40, 42, 44, 46, 48) that correspond to components (29, 30, 32, 34, 36) of the target system and links that correspond to connections between the components. Associated with the topological map is a knowledge store (50) that has a structure that reflects or corresponds to that of the topological map. Included in this store (50) is a plurality of sections or libraries each of which is provided for storing design specific data associated with one of the nodes (38, 40, 42, 44, 46, 48) of the topological map. Data received from one or more sensors on the target system is included in the topological map, and used together with the design specific information in the knowledge store to diagnose faults.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.