Managing loop interface failure
US7861123B1 · kind B1 · utility
8Cited by
4References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2007 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Mar 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2089
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Loop interface failure is managed. A first device on a loop is identified as a potential cause of the loop interface failure. The loop is tested with the first device functionally removed from the loop. Depending on the results of the test, it is determined that the first device is not the cause of the loop interface failure and a second device on the loop is identified as the cause of the loop interface failure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.