Applications of wideband EM measurements for determining reservoir formation properties
US7863901B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 2008 |
| Grant date | Jan 4, 2011 |
| Priority date | — |
| Expiry date | Dec 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining reservoir formation properties that consists of exciting the reservoir formation with an electromagnetic exciting field, measuring an electromagnetic signal produced by the electromagnetic exciting field in the reservoir formation, extracting from the measured electromagnetic signal a spectral complex resistivity as a function of frequency, fitting the spectral complex resistivity with an induced polarization model and deducing the reservoir formation properties from the fitting with the induced polarization model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.