Patent · US Active

Creating machine vision inspections using a state diagram representation

US7864178B2 · kind B2 · utility

17Cited by
14References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 2006
Grant dateJan 4, 2011
Priority date
Expiry dateNov 27, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F8/34
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A machine vision development environment that may utilize a control flow representation (preferably a state diagram representation) to specify and execute machine vision routines (e.g., sometimes referred to as inspection routines). A user may first create one or more machine vision routines using any of various methods. The user may then graphically specify a sequence of machine vision steps or operations, e.g., a machine vision inspection, using a state diagram representation. The state diagram representation may comprise a plurality of icons which represent states with corresponding operations or functions, such as, for example, Load Inspection, Part Ready, Run Inspection, Read Digital Input, etc. The various icons may be connected by wires that indicate control flow transitions, e.g., state transitions, among the states. The state diagram may then be executed to control the machine vision routines.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.