Method and apparatus for detecting embedded material within an interaction region of a structure
US7864315B2 · kind B2 · utility
10Cited by
76References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 12, 2009 |
| Grant date | Jan 4, 2011 |
| Priority date | — |
| Expiry date | Mar 23, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/28
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A system and method processes a structure comprising embedded material. The system includes a laser adapted to generate light and to irradiate an interaction region of the structure. The system further includes an optical system adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of embedded material in the interaction region. The system further includes a controller operatively coupled to the laser and the optical system. The controller is adapted to receive the detection signal and to be responsive to the detection signal by selectively adjusting the laser.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.