Method for the contactless measurement of three-dimensional objects with two layers by single-view backlit shadowgraphy
US7864339B2 · kind B2 · utility
1Cited by
7References
7Claims
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Key dates
| Filing date | Aug 21, 2007 |
| Grant date | Jan 4, 2011 |
| Priority date | — |
| Expiry date | Dec 28, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To measure a hollow three-dimensional object without contact, this object being translucent or transparent vis-á-vis a visible light, an image of the object is acquired by single-view backlit shadowgraphy, along a viewing axis, by observing this object with visible light, this image comprising at least one luminous line, an equation is established that connects at least one optogeometric parameter of the object to at least one geometric parameter of the luminous line, this geometric parameter is determined, and the optogeometric parameter is determined by means of the equation and the geometric parameter thus determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.