Wavelength-dispersive X-ray spectrometer
US7864922B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 1, 2006 |
| Grant date | Jan 4, 2011 |
| Priority date | — |
| Expiry date | Jul 15, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/24425
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.