Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems
US7865319B1 · kind B1 · utility
12Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2007 |
| Grant date | Jan 4, 2011 |
| Priority date | — |
| Expiry date | Nov 14, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for measuring the input (loading) impedance of measurement systems using a test fixture. This is done by first measuring the characteristics of an unloaded test fixture to obtain scattering parameters of the test fixture and using a splitting algorithm to calculate the scattering parameters of each transmission line leg of the test fixture. The test fixture is then measured with a measurement system attached. The test fixture effects defined by the scattering parameters are then removed from the measurement to yield the scattering parameters of the measurement system alone (measurement system effects).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.